Hayman’s diallel analysis for yield and attributing traits in sesame (Sesamum indicum L.)

  • R. A. Gami, B. B. Chauhan and R. N. Patel S.D.Agricultural University, Sardarkrushinagar


Eight sesame (Sesamum indicum L.) genotypes were crossed in a half diallel mating fashion. The analysis of variance for combining ability revealed that the mean sum of squares are due to the general combining ability were highly significant for all the traits. The t2 test specified the fulfillment of assumptions required under diallel analysis for all the traits studied except the number of effective branches per plant, capsule length (cm) and harvest index (%). The component D measures the additive effects of genes. It was significant for all the traits except seed yield per plant and harvest index. The components H1 and H2 were significant for all the traits except days to maturity revealing the importance of fixable and non-fixable component. Greater values of H1 than H2 and the ratio of H2/4H1 (< 0.25) confirmed the unbalanced distribution of gene at the loci in the parents’ implying dominance for all the traits. It was also confirmed by greater than one value of KD/KR components for all the traits which suggested the higher frequency of dominant genes than recessive genes in the parents. The component F was significant for days to flowering, days to maturity, capsule length, oil content and leaf area per plant. The graphical analysis showed the regression line intercepted Wr axis below the origin indicating over dominance for plant height, the number of seed per capsule, oil content and leaf area per plant. The regression line intercepted the positive side of Wr axis for days to maturity which implies the presence of partial dominance.


Author Biography

R. A. Gami, B. B. Chauhan and R. N. Patel, S.D.Agricultural University, Sardarkrushinagar

Assistant Research Scientst (PBG) &

Incharge AICRP on sorghum

Sorghum Research Station

S.D.Agricultural University 

Deesa-385 535

Research Article