Regression analysis and inter generation trait association in F3 and F4 generation of wheat

Abstract

The present study was carried to determine the response of selection for grain yield, yield-related componentsand to study the amount of genetic variation transferred from one generation to next generation viz., F3 and F4segregating generations of wheat derived from a single cross WH711xPBW698. The coefficient of variation washigh in the F3 generation compared to F4 which was low, indicating that homozygosity is attained in the F3generation itself. In both the generation negatively skewed platykurtic for plant height, spike length, spike weight,grain weight/ spike, the number of grains/ spike, the number of tillers/ plant, grain yield/ plant and biological yield/plant indicated that these traits were governed by many numbers of genes and most of them with governed bydominant and dominant based duplicate epistasis. Mild selection is expected to result in a rapid genetic gain forthese traits. The positively skewed platykurtic for leaf length, flag leaf area, 100 grain weight, harvest index anddays to heading indicate that these traits were governed by many genes and the majority of them displayingdominant and dominant based complementary epistasis and hence the intensive selection is required for rapidgenetic gain in these traits. Positive and significant values of intergenerational correlation and regression wereobserved for all the characters, which indicated the effectiveness and reliability of selection for these characters.The results indicate that progeny performance in the F3 generation can be  suggestive for selecting superiorprogenies in subsequent generations.